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Customer Support
Ellipso Technology
Measurement Request
  HOME > Customer Support > Measurement Request
  Sample Analysis and Consultation
  Ellipso Technology grants the most accurate and reliable result in Korea by utilizing elaborate optical equipments which Ellipso Technology have developed and manufactured. We provides solution to our customer including those data such as thickness, refractive index, extinction coefficient, and density of thin film materials and possibly other properties which optical methods can provide. The precision of the technology and the accuracy of analysis of Ellipso Technology are getting trust from a variety of companies and research institutes, as well as educational institutions.
Ellipso Technology provides measured data and analysis results of the requested samples. Based on the know-hows accumulated throughout more than 2,000 requests received from various fields for more than ten years, Ellipso Technology provides the advisory service also, to the customers who are looking for the solutions to those questions occurring in thin film development process.
  List of Sample Measurement, Analysis and Advisory Service Provided

Samsung Electronics, Samsung SDI, Samsung Electro-Mechanics, Samsung Corning, Samsung Advanced Institute of Technology, KCC, LG Electronics, LG Chemical, LG Siltron, Saehan Media, Orion Electric, SKC, Taehan Sugar, Dongwoo Fine-Chem, Kolon, KC Tech, Ness Display, Jusung Engineering, Etc.

Research Center

Korea Electrotechnology Research Institute, Korea Institute of Machinery, Korea Standards Research Institute, Korea Electronics and Telecommunications Research Institute, Korea Basic Science Institute, KIST, etc.

Educational institutions

Kyung Hee University, Seoul National University, Yonsei University, POSTECH, KAIST, Korea University, Sogang University, Ulsan University, Sungkyunkwan University, Hanyang University, Konkuk University, GIST, Chungju National University, Pusan National University, Ajou University, Inha University, etc.

Overseas HORIBA, Ltd. Miwa Opto, (Japan)
Tohoku University (Japan)
Ecole Polytechnique (France)
ANWELL (China)
INER(Institute of Nuclear Energy Research) (Taiwan)
National Taiwan University (Taiwan)

One can download the Measurement/Analysis Request Form in the link below. Please contact us for any questions.

  Contact & Registration
  Tel : +82-70-7729-8317
E-mail :
  Measurement Fee Guide
  The measurement fees are showed in the table below.
Description  Price (VAT ex.) Discount
Single Sample (Hard type : wafer,glass)
100 USD / ea -
Multiple sample of the same material 
(Example: MgO 50 nm, MgO 100 nm)
100 USD / ea > 10 EA : 10 %

Unknown Sample with Multilayer structure
(Including complex refractive index)

Sample Price & Period Discussion -

PET Film and new material

200 USD / ea -
  Because, most experienced engineers like Ph.D. degree dedicated staff has to work to handle the request for the accurate measurements of various materials, the nominal numbers of samples we can digest are 5 samples a workday.

In some cases, it requires 2-3 hours only for measure a sample, because a wide variety result of research is produced on the samples surface after various conditions of process.

We hope you will understand the reality and Ellipso Technology will do our best to provide more accurate and the rapid measurement and analysis services.

Thank You.