Ellipso Technology > Announcements

본문 바로가기
Customer Support
Ellipso Technology
Announcements
  HOME > Customer Support > Announcements

Ellipso Technology

PAGE INFORMATION

NAME MASTER DATE 19-11-19 09:31

본문

The 29th Workshop on Optical Technology 2019 

  [http://www.ellipsotech.com/bbs/board.php?bo_table=03_01&wr_id=58]

ec88dd0b46dc02e628cf6cf8a812c984_1574215472_783.jpg
 

 


KOREA TECH SHOW_2018 

  [http://www.ellipsotech.com/chn/bbs/board.php?bo_table=03_01&wr_id=57]

ec88dd0b46dc02e628cf6cf8a812c984_1574215416_9795.jpg
 

iMiD 2018 Korea Display Exhibition 

  [http://www.ellipsotech.com/bbs/board.php?bo_table=03_01&wr_id=55

EllipsoTechnology, founded in July 2000 as an ellipsometer-based company, is producing high quality optical instruments which measure and analyze structure and optical property of thin films, as well the polarization state change of light, with ultrahigh precision. We aim to become the world-widely leading company in Ellipsometry, Reflectometry, Polarimetry with our scientific and technical excellence accumulated through more than three decades. We would like to contribute to the development and growth of your company by providing the best equipments together with customized advices related with thin films and polarization state changes of light.


1. Thin Film Measurement System (Ellipsometer)
   - Thickness, optical constant(n, k) of thin film based on polarization analysis
   - Thick and thin films (sub Å ~ 10 ㎛)
   - Single or multilayer films of dielectrics, semiconductors, metals, polymers, etc.
2. Reflectivity Measurement System (Reflectometer)
   - Hi-speed measurement of reflectivity, film thickness, n & k
   - Sub micron spot size (5, 10, 25, 50 ㎛)
   - Wide area mapping, In-line and in-situ monitoring
3. Polarization Analysis System (Polarimeter)
   - Transmission axis, absorption axis of polarizing film
   - Retardation and polarizing characteristics of optical film
   - Ultra small optical anisotropy of LCD alignment layer
   - Distribution of liquid crystal and order parameter
   - Birefringence of transparent substrate

ec88dd0b46dc02e628cf6cf8a812c984_1574215574_1001.jpg
 

iMiD 2017 Korea Display Exhibition 

  [http://www.ellipsotech.com/bbs/board.php?bo_table=03_01&wr_id=54]


ec88dd0b46dc02e628cf6cf8a812c984_1574215604_7993.jpg 

 

2016_ICSE7 

  [http://www.ellipsotech.com/chn/bbs/board.php?bo_table=03_01&wr_id=51]


ec88dd0b46dc02e628cf6cf8a812c984_1574215648_9444.jpg
 

2012_Semicon Japan 

  [http://www.ellipsotech.com/chn/bbs/board.php?bo_table=03_01&wr_id=46]

ec88dd0b46dc02e628cf6cf8a812c984_1574218543_0605.jpg
 

KIDS Display Summer School_2012 

  [http://www.ellipsotech.com/chn/bbs/board.php?bo_table=03_01&wr_id=45]


Internation R&D Analysis Equipment Exhibition 2012 

  [http://www.ellipsotech.com/chn/bbs/board.php?bo_table=03_01&wr_id=44]


KIDS Display School_March 2012 

  [http://www.ellipsotech.com/chn/bbs/board.php?bo_table=03_01&wr_id=43]


A Case Study of Corporate Prosperity Project_KEIT 2011 

  [http://ktech.wmweb.kr/bbs/bbs_view.php?code=prize&idx=175314&bbs_data=aWR4PTE3NTMxNSZzdGFydFBhZ2U9MTYyJmxpc3RObz05OCZ0YWJsZT1jc19iYnNfZGF0YSZjb2RlPXByaXplJnNlYXJjaF9pdGVtPSZzZWFyY2hfb3JkZXI9JmNhdGVfbmFtZT0=%7C%7C]

ec88dd0b46dc02e628cf6cf8a812c984_1574215145_617.png
 


Korea's Best Thin Film and Measureed Polarimetric Analysis Company 

  [http://www.ellipsotech.com/chn/bbs/board.php?bo_table=03_01&wr_id=41]

ec88dd0b46dc02e628cf6cf8a812c984_1574215277_6335.jpg
 

January 2002_Optical Science & Technology_ Ellipsotechnology Introduction 

  [http://www.ellipsotech.com/chn/bbs/board.php?bo_table=03_01&wr_id=39]