Elli-RI (Textured Solarcell)
PAGE INFORMATION
DATE 19-09-04 17:17본문
Solar Cell Film Measurement System
Spectroscopic Reflectometer with Integrating Sphere (Elli-RI) offers highly accurate measurements of film thickness. It is well suited for characterization of a variety of materials especially that of SiN anti-reflective coatings on textured multi-crystalline and/or mono-crystalline silicon solar cells.
◈PERFORMANCE
1.Wavelength range : 450 nm ~ 900 nm
2.Spot size : 4 mm
3.Throughput : 1.0 sec. per point (depends on film type)
4.Measuring constants : Reflectivity, Film thickness, n, k vs λ
5.Number of layers : Up to 3 layers (depends on film type)
6.Repeatability (3σ) : ± 0.3 nm on 10 times measurement (depends on film type)
7.Thickness range : 20 nm ~ 50 μm (depends on film type)
◈REFLECTOMETER SYSTEM
1.Light source : 150 W Halogen Lamp
2.Optic system : Collimating optics system, fiber guided optics
3.Beam spot size : 4.0 mm
4.Spectral range : 450 ~ 900 nm
5.Spectrograph : CCD type
6.Integrating Sphere :
◈APPLICATION
1.Solar Cell
- Textured Mono- and/or Multi- crystalline Substrates
- Antireflective Coating(ARC) on Textured Silicon Solar Cell (SiNx, AlNx...)
- Transparent Conductive Oxides (ITO, ZnOx, doped SnO2, AZO)
- a-Si, μc-Si, poly-Si
- Organic PV Materials
- Dye Sensitized Films
2.Semiconductor
- Si, Ge, SiO2, ONO, ZnO, PR, poly-Si, GaN, GaAs
3.Display
- (incl. OLED) MgO, ITO, PR, Alq3 , CuPc, PVK, PAF, PEDT-PSS
4.Dielectrics
- SiO2, TiO3, Ta2O5, ITO, AIN, ZrO2, Si3N4, Ga2O3, Wet Oxides
5.Polymer
- Dye, NPB, MNA, PVA, PET, TAC, PR
6.Chemistry
- Organic Film(OLED) & LB Thin Film
- Elli-RI.pdf (3.0M) 36download | DATE : 2019-09-04 17:35:41