μ-Spot Spectroscopic Ellipsometer
PAGE INFORMATION
DATE 19-09-04 16:45본문



 
Spectroscopic Ellipsometer(SE), the industry standard teengology that enables one to accurately measure thickness and optical constants of thin film, simultaneously, is used for characterization of a variety of materials (e.g., dielectrics, semiconductors, organics, etc.) including AR coatings, OLED, and low(high)-materials.
◈FEATURE
   1.Easy Operation & Fast Measurement 
    2.High Reproducibility 
    3.User-Friendly Operation 
    4.Non-contact & Non-destructive 
    5.Multi-Layer Measurement 
    6.In-Situ (Sutter, ALD,PECVD etc.)
| Measuring constants | Film thickness, n, k vs λ | 
| Thickness range | sub Å ~ 10 μm (depends on film type) | 
| Wavelength range | 240 ~ 1050 nm (uv) | 
| Option of Spectral Range | |
| - (Duv:190nm, IR: 900nm ~ 1700nm, 900nm~ 2,200nm) | |
| Throughput | Normal mode(~10 sec), fast mode (1~3 sec) per point(depends on film type) | 
| Beam Spot-size | 10μm, 25 μm, 50 μm, 100μm | 
| Angle of incidence | 45°~90° (Auto variable angle) | 
| Number of layers | Up to ten(10) layers (depends on film type) | 
| Repeatability | (3σ) ±0.3 Å on 10 times measurement | 
| Dispersion relations | Cauchy, Sellmeier, Lorentz, Tauc-Lorentz, Quantum-Mechanical, Drude-TL, Drude-QM and more | 
| Providing features | Refractive Index, Extinction coefficient and optical band gap | 
| Film density and composition, Material's dispersion function library | |
| User defined models capability, Data import & export functions, - | |
| Extendable library | 
◈OPTION 
   1.Auto Mapping Stage (150 mm, 200 mm, 300 mm, Customized Size)
    2.Option of Spectral Range (UV: 193 nm ~ 1,050 nm), (IR: 900nm ~ 1,700nm, 900nm~ 2,200nm)
    3.Auto Alignment System, Automated Variable Angle of Incidence (45°~ 90°)
◈APPLICATION
   ·Thickness of Dielectrics, Semiconductors, Polymers, 
    ·Supporting Backside/Front side Reflections 
    ·Very Thin Films, Very Thick Films 
    ·Variable Substrates (Silicon, GaAs, , Al, Steel, Glass, Al2O3, PC, PET, Polymer films and Others)  
       - Semiconductor : Si, Ge, ONO, ZnO, PR, poly-Si, GaN, GaAs, Si3N4 
       - Display(incl. OLED) : ITO, PR, MgO, Alq3 , CuPc, PVK, PAF, PEDT-PSS, NPB, SiO2 , ONO 
       - Dielectrics : SiO2 , TiO2 , Ta2O5 , ITO, AIN, ZrO2 , Si3N4 , Ga2O3 , Wet oxides 
       - Polymer : Dye, NPB, MNA, PVA, PET, TAC, PR 
       - Chemistry : Organic film(OLED) & LB Thin film
       - Solar cell : SiN, a-Si, poly-Si, SiO2 , Al2O3
- μ-SpotSE_Catalog.pdf (2.2M) 162download | DATE : 2019-09-04 16:45:02
 
- Previous articleElli-SEUN (Ellipsometer) 21.03.03
 - Writing the followingElli-SE (Ellipsometer) 19.09.04
 
