페이지 정보작성자 최고관리자 댓글 0건 조회 3,078회 작성일 20-10-12 14:27
Adopting an elaborately designed reflective objective consisting of four mirrors, we have developed a
rotating-polarizer-type microspot spectroscopic ellipsometer (SE) with an ultra-small spot size. The diameter
of the focused beam, whether evaluated using a direct-image method or a knife-edge method, is less than
8.4 μm. After proper correction for the polarizing effect of the mirrors in the reflective objective, we
unambiguously determine the dispersion of the complex refractive index and the thickness of monolayer
MoS2 using the measured microspot-spectroellipsometric data. The measured ellipsometric spectra are
sensitive enough to identify small variations in thickness of MoS2 flakes, which ranged from 0.48 nm
to 0.67 nm.
- Development of a Microspot Spectroscopic Ellipsometer Using Reflective Objectives, and the Ellipsometric Characterization of Monolayer Mo.pdf (2.6M) 45회 다운로드 | DATE : 2020-10-12 14:27:41
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